Microchip MCP19122 Manual

Microchip Ikke kategoriseret MCP19122

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 2015 Microchip Technology Inc. DS00001882A-page 1

AN1882

INTRODUCTION

In today's highly competitive and highly technological

world, analog signal measurements and regulation

accuracies are ever increasing. The MCP19114/5

Digitally Enhanced Power Analog Synchronous Low-Side

Pulse-Width Modulation Controller from Microchip

Technology Inc. is an analog controller capable of

implementing several switch-mode power supply

topologies. This analog device has the distinct advantage

of a built-in PIC® core microcontroller. The microcontroller

can be used to improve overall performance without the

penalties of additional cost or device area. This

application note provides several explanations complete

with firmware examples on how to improve ratiometric

and non-ratiometric analog signal measurements.

As a digitally enhanced power analog controller, the

MCP19114/5 has a built-in 10-bit Analog-to-Digital

Converter (ADC). When using the ADC in practice,

several factors will affect the accuracy of the

measurement. These factors include noise, offset

errors, DNL/INL errors and variations in the ADC

reference voltage. These error sources will have some

initial errors specified at room temperature (+25°C).

Also, the error due to temperature variation of these

parameters should not be overlooked. This application

note will provide a means of alleviating these errors.

Utilizing factory calibration is advantageous when

attempting to compensate for measurement errors.

However, reference voltage inaccuracies and

temperature drift will directly affect the ADC

measurement result and cannot be easily corrected.

The unique feature of an integral 8-bit PIC

microcontroller allows MCP19114/5 to implement

software solutions to help resolve these issues. To

address high-accuracy requirements of ADC

measurements and the temperature drift issues, two

methods are discussed in this application note. Both

methods require software coding and hardware

configurations. Examples are provided to better

understand these methods.

ASSUMPTIONS

This application note assumes the user:

• is familiar with MCP19114/5 digitally enhanced

analog controllers;

• has basic knowledge of Analog-to-Digital

Converters (ADC);

• has working knowledge of C programming

language.

NON-RATIOMETRIC MEASUREMENT

CORRECTION

Non-ratiometric measurements are measurements

where the signal being measured is not related to the

ADC reference. The reference voltage of MCP19114/5

ADC is AVDD. Non-ratiometric measurement correction

can be achieved by measuring a signal of known

accuracy and using this measurement to correct for

other signal measurements. This method eliminates

the need to consider variations in the ADC reference

(AVDD). The MCP19114/5 internal signal VBGR (1.23V)

is factory trimmed to within 1% and has an

overtemperature tolerance of ±2.5%. This V

BGR signal

can be read internally at the MCP19114/5 ADC through

configuration of the analog test MUX (refer to registers

ABECON and ADCON0). Non-ratiometric correction is

a mathematical approach to eliminate the ADC

reference (AVDD) tolerance errors. This method is

presented in Figure 1.

FIGURE 1: Non-ratiometric

Measurement Correction.

Author: Yiwei Xiong

Microchip Technology Inc.

MCP19114/5

ADC

VBGR

VSIGNAL

ADC Measurement Correction and Optimization

for MCP19114/5

Produkt Specifikationer

Mærke:	Microchip
Kategori:	Ikke kategoriseret
Model:	MCP19122

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